Key Features and Technical Specifications

Basic Accuracy? Basic Accuracy +/-0.8%

Sweep Parameters? Frequency: 1 MHz to 3 GHz

Oscillator Level: Up to 1 dBm/0.5 Vrms/10 mArms

DC Bias Level (Option E4991A-001): +/- 40V or +/- 50 mA

Additional Features

Windows-style User Interface

Built-in VBA Programming Capability

Data Transfer via LAN Interface Multi-function Measurement Options

Dielectric/Magnetic Material Measurement (Option E4991A-002)

Wafer Measurement (Option E4991A-010)

Temperature Characteristic Measurement (Option E4991A-007) Description The E4991A RF Impedance/Material Analyzer delivers ultimate impedance measurement performance and powerful built-in analysis functions.

It provides *** functionality for component and circuit designers measuring components up to 3 GHz, aiding in their R&D efforts.

Unlike reflection measurement techniques, the E4991A uses RF current-voltage (RF-IV) technology to provide more accurate impedance measurements across a wide impedance range. The basic impedance accuracy is +/-0.8%.

High Q accuracy is beneficial for low-power component analysis. The built-in synthesizer offers a sweep range from 1 MHz to 3 GHz with 1 mHz resolution. Material Evaluation The E4991A offers *** dielectric/magnetic material measurement solutions, covering a broad frequency range from 1 MHz to 1 GHz. Wafer Measurement With the E4991A-010 Probe Station Connection Kit, you can easily connect the Agilent E4991A to an RF probe system (provided by Cascade Microtech) for wafer measurements. Temperature Characteristic Evaluation The Temperature Characteristic Test Kit E4991A-007 is a *** solution for measuring the temperature characteristics of components and materials. This option provides *** temperature characteristic analysis capabilities within a temperature range of -55°C to +150°C, along with robust temperature drift compensation functionality.